TY  - 中国邮电高校学报(英文)
A1  - 白创 吕豪 张伟 Li Fan
T1  - 	Design and verification of on-chip debug circuit based on JTAG

Y1  - 2021-06-22 00:00:00.0
JF  - 中国邮电高校学报（英文）
JO  - 中国邮电高校学报(英文)
SP  - 95
EP  - 101
VL  - 28
IS  - 3
UR  - {https://jcupt.bupt.edu.cn/CN/10.19682/j.cnki.1005-8885.2021.0019}
N1  - 10.19682/j.cnki.1005-8885.2021.0019
ER  -