@article{白创:95,
author = {[白创, 吕豪, 张伟]},
title = {	Design and verification of on-chip debug circuit based on JTAG
},
publisher = {中国邮电高校学报(英文)},
year = {2021},
journal = {中国邮电高校学报（英文）},
volume = {28},
number = {3},
eid = {95},
pages = {95-101},
keywords = {<p>
	on-chip debug, data test-direct memory access (DT-DMA), joint test action group (JTAG) interface, L-digital signal processor (L-DSP)
</p>},
doi = https://jcupt.bupt.edu.cn/CN/10.19682/j.cnki.1005-8885.2021.0019
}